Equipment Information

• Internal Name: AFM

Description

The Bruker Dimension Icon is a high-performance, large-sample Atomic Force Microscope (AFM) designed for nanoscale imaging and characterisation.The scan range is 90 µm x 90 µm in the XY plane and 10 µm in the Z-axis. It can accommodate large samples up to 200 mm in diameter and 15 mm thick. The AFM has ScanAsyst® which is a self-optimizing imaging mode that uses PeakForce Tapping® technology to automatically adjust parameters, making it easier for new users to obtain high-quality images.