Bruker Dimension ICON

Atomic Force Microscope

Bank holiday 25 Dec Bay 11B Translational Research Hub

Internal name

AFM

Equipment managers

Elizabeth Beaumont

Parco Wong

Process types

Metrology

Description

The Bruker Dimension Icon is a large-sample atomic force microscope for high-resolution nanoscale imaging and characterisation. It accepts samples up to 200mm diameter and 15mm thick with a 90 x 90um XY scan range and 10um Z range, and features ScanAsyst self-optimising imaging with PeakForce Tapping for easy, high-quality results.